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The Ninth International Conference on Advances in
System Testing and Validation Lifecycle

VALID 2017
October 8 - 12, 2017 - Athens, Greece


Committees

VALID Steering Committee
Andrea Baruzzo, IDS Interaction Design Solutions, Italy
Tadashi Dohi, Hiroshima University, Japan
Roy Oberhauser, Aalen University, Germany
Patrick Girard, LIRMM / CNRS, France
Stefan Wagner, University of Stuttgart, Germany
Hiroyuki Sato, University of Tokyo, Japan
Mehdi Tahoori, Karlsruhe Institute of Technology (KIT), Germany
Hironori Washizaki, Waseda University, Japan

VALID Industry/Research Advisory Committee
Xinli Gu, Huawei, USA
Sigrid Eldh, Ericsson AB, Sweden
Jos van Rooyen, Identify - Software Quality Services, the Netherlands
Miroslav N. Velev, Aries Design Automation, USA
Philipp Helle, Airbus Group Innovations, Germany

 

VALID 2018 Technical Program Committee

Wasif Afzal, Mälardalen University, Sweden  
Amir Alimohammad, San Diego State University, USA  
María Alpuente, Technical University of Valencia (UPV), Spain  
Aitor Arrieta, University of Mondragon, Spain  
Sebastien Bardin, CEA LIST | Paris Saclay, France  
Cesare Bartolini, ISTI - CNR, Pisa, Italy
Andrea Baruzzo, IDS Interaction Design Solutions, Italy  
Ateet Bhalla, Independent Consultant, India  
Bruno Blaskovic, University of Zagreb, Croatia  
Mohamed Boussaa, University of Rennes 1 | INRIA, France  
Mark Burgin, University of California Los Angeles (UCLA), USA  
Adnan Causevic, Researcher at Mälardalen University, Sweden  
Federico Ciccozzi, Mälardalen University, Sweden  
Bruce Cockburn, University of Alberta, Canada  
Gulsen Demiroz, Sabanci University, Istanbul, Turkey  
Dario Di Nucci, University of Salerno, Italy  
Tadashi Dohi, Hiroshima University, Japan  
Dimitris Dranidis, CITY College | International Faculty of the University of Sheffield, Greece  
Rolf Drechsler, University of Bremen/DFKI, Germany  
Lydie du Bousquet, Université Grenoble-Alpes (UGA), France  
Sigrid Eldh, Ericsson AB, Sweden  
Jicheng Fu, University of Central Oklahoma, USA  
Gregory Gay, University of South Carolina, USA  
Patrick Girard, LIRMM / CNRS, France
Xinli Gu, Huawei, USA
Bidyut Gupta, Southern Illinois University, Carbondale, USA  
Kazumi Hatayama, Gunma University, Japan
Philipp Helle, Airbus Group Innovations, Germany  
Hassan Ibrahim, Université Paris Sud, Université Paris Saclay, France  
David Kaeli, Northeastern University, Boston , USA  
Ahmed Kamel, Offutt School of Business | Concordia College, USA  
Marouane Kessentini, University of Michigan - Dearborn, USA
Takashi Kitamura, National Institute of Advanced Industrial Science and Technology (AIST), Japan
Diego Kreutz, University of Luxembourg, Luxembourg / Federal University of Pampa, Brazil  
Maurizio Leotta, University of Genova, Italy  
Lei Ma, Harbin Institute of Technology, China  
Abel Marrero, Bombardier Transportation Signal Germany GmbH, Germany  
Rivalino Matias Jr., Federal University of Uberlandia, Brazil  
Roy Oberhauser, Aalen University, Germany  
Pablo Oliveira Antonino, Fraunhofer IESE, Germany  
Roberto Pietrantuono, Università di Napoli Federico II, Italy  
Pasqualina Potena, RISE SICS Västerås, Sweden  
Paolo Prinetto, Politecnico di Torino, Italy  
Oliviero Riganelli, University of Milano Bicocca, Italy  
Mehrdad Saadatmand, RISE SICS Västerås, Sweden  
Giedre Sabaliauskaite, iTrust Centre for Research in Cyber Security | Singapore University of Technology and Design, Singapore  
Hiroyuki Sato, University of Tokyo, Japan  
Sibylle Schupp, Hamburg University of Technology (TUHH), Germany  
Josep Silva Galiana, Technical University of Valencia, Spain  
Andrea Stocco, University of British Columbia - Vancouver, Canada  
Mehdi Tahoori, Karlsruhe Institute of Technology (KIT), Germany
Nur Touba, University of Texas at Austin, USA  
Spyros Tragoudas, Southern Illinois University, USA  
Jos van Rooyen, Identify - Software Quality Services, the Netherlands
Miroslav N. Velev, Aries Design Automation, USA  
Stefan Wagner, University of Stuttgart, Germany  
Hironori Washizaki, Waseda University / National Institute of Informatics / SYSTEM INFORMATION, Japan  
Kristian Wiklund, Ericsson AB, Sweden
Robert Wille, Johannes Kepler University Linz, Austria  
Cemal Yilmaz, Sabanci University, Istanbul, Turkey
Haibo Yu, Shanghai Jiao Tong University, China

 
 

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