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The Fourth International Conference on Advances in System Testing and Validation Lifecycle

VALID 2012

November 18-23, 2012 - Lisbon, Portugal


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Details:

  • Colocated with other events part of SoftNet 2012
  • Posters will be presented during the conference
  • A Work in Progress track is available for preliminary work
  • A Research Ideas track is available for ideas in early stages

Due to many requests, submission deadline is extended to July 29.

Submission (full paper) July 7, 2012 July 29, 2012
Notification September 7, 2012
Registration September 21, 2012
Camera ready September 21, 2012

ISBN: 978-1-61208-233-2

Published by XPS (Xpert Publishing Services)

Archived in the free access ThinkMindTM Digital Library

All publications will be submitted for indexing with:
- ISI Thompson Conference Proceedings Citation Index (CPCI)
- Elsevier's EI Compendex Database, EI’s Engineering Information Index
- DBLP, IET INSPEC, and other relevant specialized indexes.
- Other indexes are being considered

Authors of selected papers will be invited to submit extended versions to a IARIA Journal

All tracks/topics are open to both research and industry contributions.

Tracks:

Robust design methodologies
Designing methodologies for robust systems; Secure software techniques; Industrial real-time software; Defect avoidance; Cost models for robust systems; Design for testability; Design for reliability and variability; Design for adaptation and resilience; Design for fault-tolerance and fast recovery; Design for manufacturability, yield and reliability; Design for testability in the context of model-driven engineering

Vulnerability discovery and resolution
Vulnerability assessment; On-line error detection; Vulnerabilities in hardware security; Self-calibration; Alternative inspections; Non-intrusive vulnerability discovery methods; Embedded malware detection

Defects and Debugging
Debugging techniques; Component debug; System debug; Software debug; Hardware debug; System debug; Power-ground defects; Full-open defects in interconnecting lines; Physical defects in memories and microprocessors; Zero-defect principles

Diagnosis
Diagnosis techniques; Advances in silicon debug and diagnosis; Error diagnosis; History-based diagnosis; Multiple-defect diagnosis; Optical diagnostics; Testability and diagnosability; Diagnosis and testing in mo bile environments

System and feature testing
Test strategy for systems-in-package; Testing embedded systems; Testing high-speed systems; Testing delay and performance; Testing communication traffic and QoS/SLA metrics; Testing robustness; Software testing; Hardware testing; Supply-chain testing; Memory testing; Microprocessor testing; Mixed-signal production test; Testing multi-voltage domains; Interconnection and compatibility testing

Testing techniques and mechanisms
Fundamentals for digital and analog testing; Emerging testing methodologies; Engineering test coverage; Designing testing suites; Statistical testing; Functional testing; Parametric testing; Defect- and data-driven testing; Automated testing; Embedded testing; Autonomous self-testing; Low cost testing; Optimized testing; Testing systems and devices; Test standards

Testing of wireless communications systems
Testing of mobile wireless communication systems; Testing of wireless sensor networks; Testing of radio-frequency identification systems; Testing of ad-hoc networks; Testing methods for emerging standards; Hardware-based prototyping of wireless communication systems; Physical layer performance verification; On-chip testing of wireless communication systems; Modeling and simulation of wireless channels; Noise characterization and validation; Case studies and industrial applications of test instruments;

Software verification and validation
High-speed interface verification and fault-analysis; Software testing theory and practice; Model-based testing; Verification metrics; Service/application specific testing; Model checking; OO software testing; Testing embedded software; Quality assurance; Empirical studies for verification and validation; Software inspection techniques; Software testing tools; New approaches for software reliability verification and validation

Testing and validation of run-time evolving systems
Automated testing for run-time evolving systems; Testing and validation of evolving systems; Testing and validation of self-controlled systems; Testing compile-time versus run-time dependency for evolving systems; On-line validation and testing of evolving at run-time systems; Modeling for testability of evolving at run-time systems; Near real-time and real-time monitoring of run-time evolving systems; Verification and validation of reflective models for testing; Verification and validation of fault tolerance in run-time evolving systems

Feature-oriented testing
Testing user interfaces and user-driven features; Privacy testing; Ontology accuracy testing; Testing semantic matching; Testing certification processes; Testing authentication mechanisms; Testing biometrics methodologies and mechanisms; Testing cross-nation systems; Testing system interoperability; Testing system safety; Testing system robustness; Testing temporal constraints; Testing transaction-based properties; Directed energy test capabilities /microwave, laser, etc./; Testing delay and latency metrics

Domain-oriented testing
Testing autonomic and autonomous systems;  Testing intrusion prevention systems; Firewall testing;  Information assurance testing; Testing social network systems; Testing recommender systems; Testing biometric systems;  Testing diagnostic systems; Testing on-line systems; Testing financial systems; Testing life threatening systems; Testing emergency systems; Testing sensor-based systems;  Testing testing systems

 
 

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