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The Fourth International Conference on Quantum, Nano and Micro Technologies

ICQNM 2010

February 10-16, 2010 - St. Maarten, Netherlands Antilles


Committees

ICQNM Advisory Chairs

David Avis, McGill University, Canada
Christian Kollmitzer, Austrian Research Centers, Austria
Victor Ovchinnikov, TKK Micronova/ Helsinki University of Technology, Finland
Bill Parker, Creative MicroSystems Corporation, USA
Vladimir Privman, Clarkson University - Potsdam, USA

ICQNM 2010 Technical Program Committee

Gerardo Adesso, Quantum Theory Group/Università di Salerno, Italy
David Avis, McGill University, Canada
Marco Bellini, Istituto Nazionale di Ottica Applicata (INOA-CNR) -- Florence, Italy
Guido Berlin, Université de Montréal, Canada
Antonio Bianconi, Sapienza University of Rome, Italy
Rainer Blatt, Österreichische Akademie der Wissenschaften // Universitaet Innsbruck, Austria
Caslav Brukner, University of Vienna // Institute of Quantum Optics and Quantum Information, Austria
Seyda Zitros Bucak, Yeditepe University, Turkey
Jacopo Buongiorno, Massachusetts Institute of Technology, USA
Irina Buyanova, Linkoping University, Sweden
Nicolas Chaillet, Université de Franche-Comté, France
Demetris Charalambous, University of Lancaster, UK / Cyprus Meteorological Service - Nicosia, Cyprus
Weimin M. Chen, Linköping University, Sweden
Taksu Cheon, Kochi University of Technology - Tosa Yamada, Japan
Paul-Robert Chouha, University of Montreal, Canada
Sorin Cotofana, Delft University of Technology, The Netherlands
Bernard Courtois, CMP, France
Petre Dini, Cisco Systems, Inc., USA / Concordia University, Canada
Daoyi Dong, Zhejiang University, China
Jens Eisert, Institute for Mathematical Sciences and QOLS, Imperial College London, UK
Shao-Ming Fei , Capital Normal University - Beijing, P. R. China
Ron Folman, Ben-Gurion University, Israel
Akihiko Fujiwara, Japan Advanced Institute of Science and Technology -- Ishikawa, Japan
Juan Carlos Garcia-Escartin, Universidad de Valladolid, Spain
Yuval Gefen, The Weizmann Institute of Science, Israel
Marco Genovese, Italian Metrological Institute (INRIM) -Torino, Italy
Hermann Grabert, Freiburg Institute for Advanced Studies (FRIAS), Germany
Masahito Hayashi, Tohoku University, Japan
Travis Humble, Oak Ridge National Laboratory, USA
Lev Ioffe, Rutgers University, USA
Elizbieta Jankowska, Central Institute for Labour Protection-National Research Institute - Warsaw, Poland
Goran Karapetrov, Argonne National Laboratory, USA
Andrei Khrennikov, University of Vaxjo, Sweden
Andreas Klappenecker, Texas A&M University, USA
Christian Kollmitzer, Austrian Research Centers, Austria
Alain J. Kreisler, SUPELEC, France
Francois Le Gall, ERATO-SORST / Japan Science and Technology Agency, Japan
Gui Lu Long, Tsinghua University, China
Alex Lvovsky, University of Calgary, Canada
Stefano Mancini, University of Camerino, Italy
Louis Marchildon, Université du Québec à Trois-Rivières, Canada
Artem E. Masunov, University of Central Florida, USA
Keiji Matsumoto, National Institute of Informatics, Japan
Constantinos Mavroidis, Northeastern University - Boston, USA
V.R.S.S. Mokkapati, Delft University of Technology, The Netherlands
Tal Mor, Technion, Isreal
Masaki Nakanishi, Yamagata University, Japan
Rajagopal Nagarajan, University of Warwick, UK
Munehiro Nishida, Hiroshima University, Japan
Luis Roa Oppliger, Universidad de Concepción, Chile
Victor Ovchinnikov, TKK Micronova/ Helsinki University of Technology, Finland
Telhat Ozdogan, Rize University, Turkey
Matteo G. A. Paris, Università degli studi di Milano, Italy
Bill Parker, Creative MicroSystems Corporation, USA
Martin B. Plenio, Imperial College London, UK
Vladimir Privman, Clarkson University - Potsdam, USA
Stefan Rass, Klagenfurt University, Austria
Norman Hugh Redington, MIT, USA
Philippe Renaud, Ecole Polytechnique Federale de Lausanne, Switzerland
Gerasimos G. Rigatos, Industrial Systems Institute -Rion Patras, Greece
Andrew Sachrajda, National Research Council of Canada, Canada
Barry Sanders, iCORE/University of Calgary, Canada
Peter Schartner, University of Klagenfurt, Austria
Bijan Shirinzadeh, Monash University - Clayton, Australia
Ingo Sieber, Institut fuer Angewandte Informatik (IAI)/ Forschungszentrum Karlsruhe GmbH - Karlsruhe, Germany
Johannes Skaar, Norwegian University of Science and Technology - Trondheim / UNIK - University Graduate Center - Kjeller, Norway
Don Sofge, Naval Research Laboratory, USA
Francesco Tafuri, Seconda Università Degli Studi di Napoli, Italy
Tetsufumi Tanamoto, Advanced LSI laboratory/Toshiba R&D Center - Kawasaki, Japan
Tzyh Jong Tarn, Washington University - St. Louis, USA
Sergey Vakulenko, Saint Petersburg State University of Technology and Design / Academy of Sciences, Russia
Amichay Vardi, Ben-Gurion University of the Negev - Beer-Sheva, Israel / Harvard University, USA
Manuel Vázquez, Instituto de Ciencia de Materiales - CSIC, Madrid, Spain
Xudong Wang, University of Wisconsin-Madison, USA
Yimin Xuan, Nanjing University of Science and Technology, China
Shigeru Yamashita, Ritsumeikan University, Japan
Jian Qiang You (J. Q. You), Fudan University - Shanghai, China
Alexandre Zagoskin, Loughborough University, UK
Qi-Ren Zhang, Peking University - Beijing, China
Wen-Ran Zhang, Georgia Southern University, USA
J. X. Zheng-Johansson, Institute of Fundamental Physics Research - Nyköping, Sweden

 
 

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