The Twelfth International Conference on Advances in System Testing and Validation Lifecycle

VALID 2020

October 18, 2020 to October 22, 2020 - Porto, Portugal

Deadlines

Submission

Jul 22, 2020

Notification

Aug 13, 2020

Registration

Aug 25, 2020

Camera ready

Sep 03, 2020

Deadlines differ for special tracks. Please consult the conference home page for special tracks Call for Papers (if any).

Publication

Published by IARIA Press (operated by Xpert Publishing Services)

Archived in the Open Access IARIA ThinkMind Digital Library

Prints available at Curran Associates, Inc.

Authors of selected papers will be invited to submit extended versions to a IARIA Journal

Indexing Procedure

Affiliated Journals

VALID 2020 - The Twelfth International Conference on Advances in System Testing and Validation Lifecycle

October 18, 2020 - October 22, 2020

VALID 2020: Committees

VALID 2020 Steering Committee

 

Lorena Parra Boronat
Instituto Madrileño de Investigación y Desarrollo Rural, Agrario y Alimentario
and
Universitat Politecnica de Valencia
Spain


   

 

VALID 2020 Technical Program Committee

Sajid Anwer, Griffith University, Brisbane, Australia
Deepika Badampudi, Blekinge Institute of Technology, Sweden
Sebastien Bardin, CEA LIST, France
Andrea Baruzzo, Interaction Design Solutions / University of Udine, Italy
Davide Basile, ISTI CNR Pisa, Italy
Ateet Bhalla, Independent Consultant, India
Bruno Blaskovic, University of Zagreb, Croatia
Hanifa Boucheneb, École Polytechnique de Montréal, Canada
Laura Brandán Briones, FaMAF | Univ. de Córdoba, Argentina
Mark Burgin, University of California Los Angeles (UCLA), USA
Laura Carnevali, University of Florence, Italy
Arjun Chaudhuri, Duke University, USA
Peter Clarke, Florida International University, USA
Bruce Cockburn, University of Alberta, Canada
Aleksa Damljanovic, Politecnico di Torino, Italy
Hichem Debbi, University of M'sila, Algeria
Giorgio Di Natale, TIMA - CNRS / Université Grenoble-Alpes / Grenoble INP UMR 5159, France
Luigi Dilillo, LIRMM (Laboratoire de Informatique Robotique et Microélectronique de Montpellier), France
Nikos Foutris, The University of Manchester, UK
Jicheng Fu, University of Central Oklahoma, USA
Gregory Gay, Chalmers and the University of Gothenburg, Sweden
Bidyut Gupta, Southern Illinois University, Carbondale, USA
Zoltán Horváth, Eötvös Loránd University, Budapest, Hungary
Sebastian Huhn, University of Bremen / DFKI Bremen, Germany
Ahmed Kamel, Concordia College, Moorhead, USA
Basel Katt, Norwegian University of Science and Technology, Norway
Dirk Kuhlmann, Fraunhofer-Institute for System- and Innovation Research (ISI), Germany
Richard Kuhn, National Institute of Standards & Technology, USA
Maurizio Leotta, University of Genova, Italy
Xia Li, The University of Texas at Dallas, USA
Yan-Fu Li, Tsinghua University, China
Chu-Ti Lin, National Chiayi University, Taiwan
Eda Marchetti, ISTI-CNR, Pisa, Italy
Abel Marrero, Bombardier Transportation Signal Germany GmbH, Germany
Vadim Mutilin, Ivannikov Institute for System Programming of the RAS (ISPRAS), Moscow, Russia
Roy Oberhauser, Aalen University, Germany
Rasha Osman, The Higher Technological Institute, Egypt
Adriano Peron, University of Napoli "Federico II", Italy
Pasqualina Potena, RISE Research Institutes of Sweden AB, Sweden
Claudia Raibulet, University of Milano-Bicocca, Italy
Kristin Yvonne Rozier, Iowa State University, USA
Hiroyuki Sato, University of Tokyo, Japan
Josep Silva, Universitat Politècnica de València, Spain
Maria Spichkova, RMIT University, Australia
Salvador Tamarit, PFS Group, Spain
Bedir Tekinerdogan, Wageningen University, The Netherlands
Spyros Tragoudas, Southern Illinois University, USA
Ana Turlea, University of Bucharest, Romania
Visa Vallivaara, NIST - National Institute of Standards and Technology | VTT - Technical Research Centre of Finland | University of Oulu, Finland
Jos van Rooyen, Identify - Software Quality Services, Netherlands
Miroslav N. Velev, Aries Design Automation, USA
Hironori Washizaki, Waseda University / National Institute of Informatics / SYSTEM INFORMATION, Japan
Kristian Wiklund, Ericsson AB, Sweden
Dietmar Winkler, Institute for Information Systems Engineering | TU Wien, Austria
Xiaofei Xie, Nanyang Technological University, Singapore
Haibo Yu, Kyushu Sangyo University, Japan
Pavol Zavarsky, Concordia University of Edmonton, Canada