The Tenth International Conference on Advances in System Testing and Validation Lifecycle

VALID 2018

October 14, 2018 to October 18, 2018 - Nice, France

Deadlines

Submission

Jun 26, 2018

Notification

Jul 28, 2018

Registration

Aug 11, 2018

Camera ready

Aug 22, 2018

Publication

Published by IARIA XPS Press

Archived in the free access ThinkMind Digital Library

Prints available at Curran Associates, Inc.

Authors of selected papers will be invited to submit extended versions to a IARIA Journal

Affiliated Journals

VALID 2018 - The Tenth International Conference on Advances in System Testing and Validation Lifecycle

October 14, 2018 - October 18, 2018

VALID 2018: Committees

VALID Steering Committee
Andrea Baruzzo, IDS Interaction Design Solutions, Italy
Tadashi Dohi, Hiroshima University, Japan
Roy Oberhauser, Aalen University, Germany
Patrick Girard, LIRMM / CNRS, France
Stefan Wagner, University of Stuttgart, Germany
Hiroyuki Sato, University of Tokyo, Japan
Mehdi Tahoori, Karlsruhe Institute of Technology (KIT), Germany
Hironori Washizaki, Waseda University, Japan

VALID Industry/Research Advisory Committee
Xinli Gu, Huawei, USA
Sigrid Eldh, Ericsson AB, Sweden
Jos van Rooyen, Identify - Software Quality Services, the Netherlands
Miroslav N. Velev, Aries Design Automation, USA
Philipp Helle, Airbus Group Innovations, Germany

 

VALID 2018 Technical Program Committee

Wasif Afzal, Mälardalen University, Sweden  
Amir Alimohammad, San Diego State University, USA  
María Alpuente, Technical University of Valencia (UPV), Spain  
Moussa Amrani, Namur Digital Institute, Belgium
Aitor Arrieta, University of Mondragon, Spain  
Sebastien Bardin, CEA LIST | Paris Saclay, France  
Cesare Bartolini, ISTI - CNR, Pisa, Italy
Andrea Baruzzo, IDS Interaction Design Solutions, Italy  
Saddek Bensalem, Université Grenoble Alpes/Verimag, France
Ateet Bhalla, Independent Consultant, India  
Bruno Blaskovic, University of Zagreb, Croatia  
Sergiy Bogomolov, Australian National University, Australia
Mohamed Boussaa, University of Rennes 1 | INRIA, France  
Mark Burgin, University of California Los Angeles (UCLA), USA  
Samuele Buro, University of Verona, Italy
Vinicius Cardoso Garcia, Universidade Federal de Pernambuco, Brazil
Adnan Causevic, Mälardalen University, Sweden
Federico Ciccozzi, Mälardalen University, Sweden  
Bruce Cockburn, University of Alberta, Canada  
Hichem Debbi, University of Mohamed Boudiaf-M'sila, Algeria
Gulsen Demiroz, Sabanci University, Istanbul, Turkey  
Stefano Di Carlo, Politecnico di Torino, Italy
Dario Di Nucci, Vrije Universiteit Brussel, Belgium
Luigi Dilillo, LIRMM (Laboratoire de Informatique Robotique et Microélectronique de Montpellier), France
Tadashi Dohi, Hiroshima University, Japan  
Dimitris Dranidis, CITY College | International Faculty of the University of Sheffield, Greece  
Rolf Drechsler, University of Bremen/DFKI, Germany  
Lydie du Bousquet, Université Grenoble-Alpes (UGA), France  
Sigrid Eldh, Ericsson AB, Sweden  
Marie Farrell, University of Liverpool, UK
Hermann Felbinger,
Graz University of Technology / AVL List GmbH, Austria
Jicheng Fu, University of Central Oklahoma, USA  
Gregory Gay, University of South Carolina, USA  
Patrick Girard, LIRMM / CNRS, France
Xinli Gu, Huawei, USA
Bidyut Gupta, Southern Illinois University, Carbondale, USA  
Kazumi Hatayama, Gunma University, Japan
Philipp Helle, Airbus Group Innovations, Germany  
Lom Messan Hillah, Université Paris Nanterre / Sorbonne Université / CNRS - Laboratoire d'Informatique de Paris 6 - LIP6, France
Zoltán Horváth, Eötvös Loránd University, Budapest, Hungary
Hassan Ibrahim, Université Paris Sud, Université Paris Saclay, France  
Daisuke Ishii, University of Fukui, Japan
David Kaeli, Northeastern University, Boston , USA  
Ahmed Kamel, Offutt School of Business | Concordia College, USA  
Marouane Kessentini, University of Michigan - Dearborn, USA
Narges Khakpour, Linnaeus University, Sweden
Takashi Kitamura, National Institute of Advanced Industrial Science and Technology (AIST), Japan
Diego Kreutz, University of Luxembourg, Luxembourg / Federal University of Pampa, Brazil  
Moez Krichen, Al-Baha University, Saudi Arabia / University of Sfax, Tunisia
Herbert Kuchen, University of Münster, Germany
Maurizio Leotta, University of Genova, Italy  
Bruno Lima, University of Porto / INESC TEC, Portugal
Francesca Lonetti, ISTI-CNR, Italy
Lei Ma, Harbin Institute of Technology, China  
Libero Maesano, Simple Engineering, France
Hans Manhaeve, Ridgetop Europe nv. / Ridgetop Group inc., Belgium
Eda Marchetti, CNR-ISTI, Pisa, Italy
Abel Marrero, Bombardier Transportation Signal Germany GmbH, Germany  
Mieke Massink, CNR-ISTI, Pisa, Italy
Rivalino Matias Jr., Federal University of Uberlandia, Brazil  
Amin Milani Fard, Simon Fraser University, Vancouver, Canada
Andreas Morgenstern, Fraunhofer Institute for Software Engineering (IESE), Germany
Roy Oberhauser, Aalen University, Germany  
Pablo Oliveira Antonino, Fraunhofer IESE, Germany  
Yassine Ouhammou, LIAS/ISAE-ENSMA, France
Giovanni Pau, Sorbonne Universitè, Paris, France
Adriano Peron, University of Naples "Federico II", Italy
Roberto Pietrantuono, Università di Napoli Federico II, Italy  
Pasqualina Potena, RISE SICS Västerås, Sweden  
Paolo Prinetto, Politecnico di Torino, Italy  
Claudia Raibulet, University of Milano-Bicocca, Italy
Oliviero Riganelli, University of Milano Bicocca, Italy  
Nima Roohi, University of Pennsylvania, USA
Mehrdad Saadatmand, RISE SICS Västerås, Sweden  
Giedre Sabaliauskaite, iTrust Centre for Research in Cyber Security | Singapore University of Technology and Design, Singapore  
Hiroyuki Sato, University of Tokyo, Japan
Josep Silva Galiana, Technical University of Valencia, Spain  
Marjan Sirjani, Mälardalen University, Sweden / Reykjavik University, Iceland
Maria Spichkova, RMIT University, Australia
Andrea Stocco, University of British Columbia - Vancouver, Canada  
Mehdi Tahoori, Karlsruhe Institute of Technology (KIT), Germany
Salvador Tamarit, Universitat Politècnica de València, Spain
Bedir Tekinerdogan, Wageningen University, The Netherlands
Spyros Tragoudas, Southern Illinois University, USA
Jos van Rooyen, Identify - Software Quality Services, the Netherlands
Miroslav N. Velev, Aries Design Automation, USA  
Arnaud Virazel, LIRMM - University of Montpellier/CNRS, France
Stefan Wagner, University of Stuttgart, Germany  
Neil Walkinshaw, University of Leicester, UK
Hironori Washizaki, Waseda University / National Institute of Informatics / SYSTEM INFORMATION, Japan  
John Wiegley, BAE Systems, UK
Kristian Wiklund, Ericsson AB, Sweden
Robert Wille, Johannes Kepler University Linz, Austria  
Cemal Yilmaz, Sabanci University, Istanbul, Turkey
Haibo Yu, Shanghai Jiao Tong University, China